Analytik Jena B-100YP 95-0127-04表面檢查燈
Analytik Jena B-100YP表面檢查燈可快速檢查加工表面的瑕疵，灰塵，異物等小至10微米的瑕疵、小顆粒，高強(qiáng)度抗沖擊外殼由有Cool-Touch阻熱材料制造，可長(zhǎng)時(shí)間工作不產(chǎn)生高溫。黃色濾光片能濾掉波長(zhǎng)小于500nm的光線，產(chǎn)生543nm、574和576nm的光線。高對(duì)比度的光線可檢測(cè)表面小于10微米的顆粒。b-100Y鋁合金外殼，B-100YP帶塑料外殼。表面晶粒檢查燈主要用于LCD濾光片、偏光板、晶圓、半導(dǎo)體、玻璃或金屬表面刮痕及灰塵檢查。
B-100YP 95-0127-04表面檢查燈主要特點(diǎn)
? 檢查精密加工表面的瑕疵、污點(diǎn)、異物等
? 快速無損檢測(cè)小至10微米的瑕疵、小顆粒
? 有效地探測(cè)出生產(chǎn)過程是早期的污物，節(jié)省生產(chǎn)時(shí)間及不必要的成本
? 100瓦高強(qiáng)度汞燈發(fā)出543,574及576nm波長(zhǎng)光譜
? 黃色濾色片濾掉波長(zhǎng)小于500nm的光線，防止產(chǎn)生熒光干擾
? 高對(duì)比度的光線能清晰檢測(cè)到精細(xì)的表面粒子
? B-100Y是鋁合金外殼; B-100YP帶塑料外殼
? 燈頭人體工學(xué)設(shè)計(jì)，易于操作
Analytik Jena B-100Y和B-100YP
These models feature a yellow filter which blocks wavelengths shorter than 500 nm and produces three strong mercury lines at 543, 574 and 576 nm. The high contrast light is produced for fine surface particle detection. Particles down to 10 microns are routinely visible with this lamp. The B-100Y is built with aluminum housing and the B-100YP with a plastic housing. These lamps are excellent for semiconductor wafer inspection as most photoresist absorption occurs below 450 nm.
Applications include:
Fluorescence Inspections
Non Destructive Testing
Leak Detection
Readmission
Order Information
| 115 V | 230 V | Model | Description |
| 95-0044-22 | 95-0044-02 | B-100A | Longwave UV Lamp |
95-0044-03 | 95-0044-04 | B-100A/R | Longwave UV Lamp 20 ft. cords |
| 95-0127-01 | 95-0127-02 | B-100AP | High Intensity 100 Watt Longwave UV Lamp, Cool-Touch Housing |
| 95-0127-06 | 95-0127-07 | B-100AP/R | High Intensity 100 Watt Longwave UV Lamp, 20 ft cords, Cool-Touch Housing |
| 95-0044-24 | 95-0044-18 | B-100Y | High Intensity Wafer Inspection Lamp, Yellow Filter |
| 95-0127-03 | 95-0127-04 | B-100YP | High Intensity Wafer Inspection Lamp, Yellow Filter, 100 Watt, Cool-Touch Housing |
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